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OSSI satellite components radiation effects study

In space, radioactive particles will affect alot on electronics. conference provides database for radiation effects on components.

For releasing such a valuable and expensive data, we should thank them.

Radiation effects

  • SEU (Single Event Upset)
  • SEL (Single Event Latchup)
  • TID


  • SEU → Freeze monitoring and soft / hard reset
  • SEU → EDAC memory structure
  • SEU → TMR (Triple Mode Redundancy) Hardware Architecture
  • SEL → Current sensing and hard reset
parts/radiation.txt · Last modified: 2012/02/18 14:51 by ossi